<i>X-Light</i>: an open-source software written in Python to determine the residual stress by X-ray diffraction

نویسندگان

چکیده

X-Light is an open-source software that written in Python with a graphical user interface. was developed to determine residual stress by X-ray diffraction. This can process the 0D, 1D and 2D diffraction data obtained laboratory diffractometers or synchrotron radiation. provides several options for analysis five functions fit peak: Gauss, Lorentz, Pearson VII, pseudo-Voigt Voigt. The determined conventional sin 2 ψ method fundamental method.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Manpy: an Open Source Library of Manufacturing Simulation Objects Written in Python

Discrete Event Simulation (DES) is arguably one of the most popular operation research techniques. Even though Commercial-Off-The-Shelf (COTS) DES software has reached an impressive state of maturity, there are still problems that deter organizations from investing in such tools and adopting DES in their decision support processes. On the other hand, the nature of Open Source (OS) software deve...

متن کامل

The X - ray spectral evolution of the ultraluminous X - ray source Holmberg IX X - 1

We present a new analysis of X-ray spectra of the archetypal ultraluminous X-ray source (ULX) Holmberg IX X-1 obtained by the Swift, XMM-Newton and NuSTAR observatories. This ULX is a persistent source, with a typical luminosity of ∼10 erg s, that varied by a factor of 4 – 5 over eight years. We find that its spectra tend to evolve from relatively flat or two-component spectra in the medium ene...

متن کامل

EVALUATION OFDISLOCATION STRUCTURE AND CRYSTALLITE SIZE IN WORN AL-SI ALLOY BY X-RAY DIFFRACTION

Abstract: powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size anddislocation structures. In this paper the effect of the sliding on the microstructure of A356 in the as-cast and heattreated conditions are studied, The X-ray phase analysis shows that with increasing applied load, the dislocationdensity is increased, whereas the crysta...

متن کامل

Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method

The paper deals with the depth determination of residual stress states from diffraction data. First an historical overview of the known approaches is given. Then we apply the approximate inverse method to this problem. This method is known to be very efficient and stable with respect to noise-contaminated data. It is even possible to prove convergence and it allows an error estimate of the calc...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of Applied Crystallography

سال: 2021

ISSN: ['1600-5767', '0021-8898']

DOI: https://doi.org/10.1107/s160057672100618x